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Flatness control
Currently most of the flatness measurement equipment, best known as “planar”, are implemented using optoelectronic sensors disposed on a row perpendicular to the tile's direction. )
Sensors read the distance, along the Z axis, of the tile's surface while the tile pass under the sensors on the conveyor.This approach offers the advantage of the independency from dimension along X axis, the direction of the movement, and it is very compact, but suffers the serious problem of mechanical perturbation induced by vibration, irregularities of belts, irregularities of tiles contact with belts, .... In addition sensors can cover only a limited part of the tile surface both along X and Y axis and they can fail the recognition of defects, if these defects do not fall under the sensors. The single acquisition approach used by EXAMINA, overcomes these problems because it uses LASER sources to project lines onto the surface and a area scan camera to take a single picture of the whole tile. The single shot freezes tiles, so that mechanical problems do not influence the measurement, but on the other end this solution occupies more room on the line and, expecially as formats grow, it requires more expensive cameras, more LASER projectors, ... The brand new approach introduced by EXAMINA comprises the positive aspects of both solutions, maintaining limited dimension, independency from dimension on X axis, and complete insensibility from mechanical disturbance. Based on an innovative principle of image acquisition and processing, it can implement either the standalone flatness measurement equipment XML, or it can be integrated into XMS, EXAMINA Automatic Sorting System. |
